Amplitude Modulation Atomic Force Microscopy by Ricardo Garcia PDF

By Ricardo Garcia

Filling a niche within the literature, this booklet beneficial properties in-depth discussions on amplitude modulation AFM, delivering an summary of the speculation, instrumental concerns and purposes of the approach in either academia and undefined. As such, it comprises examples from fabric technological know-how, tender condensed topic, molecular biology, and biophysics, between others. The textual content is written in this type of method as to permit readers from diversified backgrounds and degrees of craftsmanship to discover the data compatible for his or her wishes.

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Extra resources for Amplitude Modulation Atomic Force Microscopy

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5 nm, while the phase shift shows a jump from 110 to 65 . 7 Displacements and Distances The analyst of amplitude modulation AFM experiments requires to be familiar with at least five different distances and/or displacements. In some cases, the conceptual differences among them are subtle; however, they have remarkable experimental implications. 12 illustrates the definition of the tip deflection z(t) and the tip displacement with respect to the sample surface S(t). The optical beam deflection method directly measures the cantilever slope, which can relate to the tip deflection.

The van der Waals forces between atoms and/or molecules have their origin in electric dipole interactions. The dipoles could be permanent or either induced by another permanent dipole or by thermal fluctuations. The three possible dipole interaction potentials, dipole dipole, dipole induced dipole, or induced dipole induced dipole, scale as 1/r6, where r is the distance between atoms or molecules. Force microscopy experiments usually deal with ensembles of atoms or molecules. The net van der Waals force is the result of adding all the individual dipole interactions between tip and surface atoms [1, 2].

On the other hand, the proximity of the tip to the surface makes it possible to confine the tip surface interaction to the size of the tip’s apex. 1 Cantilevers Cantilevers are fabricated in microelectronic facilities with some of the technologies used to fabricate integrated circuits such as photolithography and etching procedures [21, 22]. The majority of AFM cantilevers are made of either silicon or silicon nitride (Si3N4). Most commercial cantilevers are either v shaped or rectangular beams.

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